{"id":720,"date":"2023-10-30T11:42:58","date_gmt":"2023-10-30T10:42:58","guid":{"rendered":"https:\/\/ceza.de\/?post_type=infrastructure&#038;p=720"},"modified":"2024-02-23T15:15:11","modified_gmt":"2024-02-23T14:15:11","slug":"electron-beam-microanalysis-xflash","status":"publish","type":"infrastructure","link":"https:\/\/ceza.de\/english\/cezapedia\/infrastructure\/electron-beam-microanalysis-xflash","title":{"rendered":"Electron beam microanalysis Xflash"},"content":{"rendered":"\n<p>Energy dispersive electron beam microanalysis (EDX), silicon drift detector (SDD) with a resolution of at least 127 eV with Mn-K\u03b1 and analysis software.<\/p>\n\n\n\n<p>Manufacturer: Bruker<\/p>\n","protected":false},"template":"","meta":{"editor_notices":[]},"class_list":["post-720","infrastructure","type-infrastructure","status-publish","hentry"],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v27.4 - https:\/\/yoast.com\/product\/yoast-seo-wordpress\/ -->\n<title>Electron beam microanalysis Xflash - CEZA EN<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/ceza.de\/english\/cezapedia\/infrastructure\/electron-beam-microanalysis-xflash\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Electron beam microanalysis Xflash - CEZA EN\" \/>\n<meta property=\"og:description\" content=\"Energy dispersive electron beam microanalysis (EDX), silicon drift detector (SDD) with a resolution of at least 127 eV with Mn-K\u03b1\u2026\" \/>\n<meta property=\"og:url\" content=\"https:\/\/ceza.de\/english\/cezapedia\/infrastructure\/electron-beam-microanalysis-xflash\" \/>\n<meta property=\"og:site_name\" content=\"CEZA EN\" \/>\n<meta property=\"article:publisher\" content=\"https:\/\/www.facebook.com\/people\/Curt-Engelhorn-Zentrum-Arch%c3%a4ometrie\/100067599853568\/\" \/>\n<meta property=\"article:modified_time\" content=\"2024-02-23T14:15:11+00:00\" \/>\n<meta property=\"og:image\" content=\"https:\/\/ceza.de\/english\/wp-content\/uploads\/sites\/2\/2023\/11\/fallback-ceza-logo.png\" \/>\n\t<meta property=\"og:image:width\" content=\"1200\" \/>\n\t<meta property=\"og:image:height\" content=\"800\" \/>\n\t<meta property=\"og:image:type\" content=\"image\/png\" \/>\n<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n<script type=\"application\/ld+json\" class=\"yoast-schema-graph\">{\"@context\":\"https:\\\/\\\/schema.org\",\"@graph\":[{\"@type\":\"WebPage\",\"@id\":\"https:\\\/\\\/ceza.de\\\/english\\\/cezapedia\\\/infrastructure\\\/electron-beam-microanalysis-xflash\",\"url\":\"https:\\\/\\\/ceza.de\\\/english\\\/cezapedia\\\/infrastructure\\\/electron-beam-microanalysis-xflash\",\"name\":\"Electron beam microanalysis Xflash - CEZA EN\",\"isPartOf\":{\"@id\":\"https:\\\/\\\/ceza.de\\\/english\\\/#website\"},\"datePublished\":\"2023-10-30T10:42:58+00:00\",\"dateModified\":\"2024-02-23T14:15:11+00:00\",\"breadcrumb\":{\"@id\":\"https:\\\/\\\/ceza.de\\\/english\\\/cezapedia\\\/infrastructure\\\/electron-beam-microanalysis-xflash#breadcrumb\"},\"inLanguage\":\"en-US\",\"potentialAction\":[{\"@type\":\"ReadAction\",\"target\":[\"https:\\\/\\\/ceza.de\\\/english\\\/cezapedia\\\/infrastructure\\\/electron-beam-microanalysis-xflash\"]}]},{\"@type\":\"BreadcrumbList\",\"@id\":\"https:\\\/\\\/ceza.de\\\/english\\\/cezapedia\\\/infrastructure\\\/electron-beam-microanalysis-xflash#breadcrumb\",\"itemListElement\":[{\"@type\":\"ListItem\",\"position\":1,\"name\":\"Home\",\"item\":\"https:\\\/\\\/ceza.de\\\/english\\\/\"},{\"@type\":\"ListItem\",\"position\":2,\"name\":\"Electron beam microanalysis Xflash\"}]},{\"@type\":\"WebSite\",\"@id\":\"https:\\\/\\\/ceza.de\\\/english\\\/#website\",\"url\":\"https:\\\/\\\/ceza.de\\\/english\\\/\",\"name\":\"CEZA EN\",\"description\":\"With science, high-tech &amp; 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